An Approach for a Relevance Analysis of Nanotechnology

DS 42: Proceedings of ICED 2007, the 16th International Conference on Engineering Design, Paris, France, 28.-31.07.2007

Year: 2007
Author: Spath, Dieter; Warschat, Joachim; Heubach, Daniel
Series: ICED
Section: Organization
Page(s): 651-652 (exec. Summ.), full paper no. DS42_P_165

Keywords: Technology assessment, nanotechnology, technology management, innovation process


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